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April 28 - 10 am to 4 pm

April 29 - 10 am to 4 pm

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FormFactor, Inc. (NASDAQ:FORM), is a leading provider of essential test and measurement technologies along the full IC life cycle – from metrology and inspection, characterization, modeling, reliability, and design debug, to qualification and production test. Semiconductor companies rely upon FormFactor’s products and services to accelerate profitability by optimizing device performance and advancing yield knowledge. The Company serves customers through its network of facilities in Asia, Europe, and North America. For more information, visit the Company’s website at

Abstract for Spotlight Presentation:

Solutions for Testing Higher Frequencies with Better Accuracy and More Data

Anthony Lord, Director, RF Segment Business Development, FormFactor Inc.


With new on-wafer test demands of 5G rollout, 6G pathfinding, vehicle-to-everything (V2X), imaging as well as aerospace and defence applications - there are definite needs to test to higher frequencies, with better accuracy and more data. Challenges come into play now such as measurement channel loss, calibration drift and the general lack of experience of measuring above 110GHz. This presentation will show a selection of proven on-wafer probing solutions, with data, for frequencies as high as 1.1THz. Using optimized measurement channels and autonomous calibration monitoring and re-calibration these measurement challenges can now be readily addressed.

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